About Instrument and its applications-
Scanning Probe Microscopy (SPM) is a family of high-resolution surface imaging and measurement techniques that work by physically scanning a tiny probe (a sharp tip) very close to a sample surface and monitoring how the probe interacts with that surface to generate detailed information about its structure or properties
Here is list of the measurements available at our centre to cater the needs of users:
1) Atomic Force Microscopy (AFM):
Measures forces between the tip and surface using a micro-cantilever. Can image virtually any surface (conductive or not) with nanometer-scale resolution
2) Kelvin Probe Force Microscopy (KPFM):
Maps electrical surface potential or work function
3) Magnetic Force Microscopy (MFM):
Sensitive to magnetic forces, used for imaging magnetic structures
4) Electrostatic Force Microscopy (EFM):
Detects long-range electrostatic forces between a conductive AFM tip and the sample surface by applying a bias voltage between them
5) Scanning Tunneling Microscopy (STM):
Uses quantum tunneling current between a conductive tip and sample to image surfaces at atomic resolution. Requires conductive samples

General Information-
Make- Bruker
Model- Dimension Nexus
Year of Installation- 2026

Specifications-
1) Single tube scanner to scan from large and small area with high resolution
2) X-Y scan range: 90 µm x 90 µm
3) Z range: 10 µm
4) XY stage: Fully motorized 150 mm x 150 mm with movement accuracy is approx. 2 µm unidirectional and 6 µm in bidirectional
5) Sample size/holder: 150 mm vacuum chuck for samples, ≤ 150 mm diameter, ≤ 15 mm thick
6) Z travel: Fully motorized 15 mm with 0.1 µm step
7) Sample stage has vacuum chuck to hold small samples
8) Microscope optics: 5 MP digital camera; 180 μm to 1465 μm viewing area; digital zoom and motorized focus. Optical camera is integrated with 10x objective
9) Optical resolution is 1 µm
10) Motorized focus via software is available to focus separately on cantilever as well as sample

Sample Requirements-
Solid or Thin Film sample
[Sample Dimension (Max.): 50 mm (L) x 50 mm (B) x 10 mm (H)]


Contact Person-
Dr. Vipin Chawla
Technical Officer-III
Email: vipin.mic@iitr.ac.in
Tel: +91-1332-284580